2D X-Ray and 3D CT Scanners

NDT Electronics Testing Solutions

Precision tools for inspecting semiconductors, PCBs and more 

The phoenix microme|x neo and nanome|x neo provide high-resolution 2D X-ray technology and 3D computed tomography( CT) scanning in one system, enabling non-destructive testing (NDT) of electronic components – such as semiconductors, PCBs, lithium-ion batteries -- in industrial, automotive, aviation and consumer electronics industries. With innovative engineering coupled with ultra-high positioning accuracy, phoenix microme|x neo and nanome|x neo are ideally suited for industrial X-ray electronics inspections in process and quality control, failure analysis and R&D.

Discover new features of the latest Phoenix Nanome|x and Microme|x Neo product release

    Unique features

    • Automated inspection in micrometer range with easy to program CAD based μAXI
    • Active cooling for high dynamic, live imaging at 180 kV configurations
    • Brilliant live imaging and fast data acquisition for 3D CT / planarCT scanning with:
    • 30 frames per second with Waygate Technologies’ highly dynamic DXR flat panel detector
    • Up to 2 times faster data acquisition at same high image quality level with diamond|window
    • Option provided for 3D CT scans within up to 10 seconds

    We used to be GE Inspection Technologies, now we’re Waygate Technologies, a global leader in NDT solutions with more than 125 years of experience in ensuring quality, safety and productivity.

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