Industrial Metrology: 3D Scanning Solutions
Precision and accuracy play an eminent role within any production process like light metal castings, plastics injection molding, additive manufacturing, and final assembly. 3D industrial metrology tasks range from prototype inspection to full process control and final acceptance checks. Total confidence in the safety and reliability of parts and assets you produce requires highly precise measurements throughout the manufacturing process.
Measuring the inaccessible
State of the art coordinate measurement machines (CMM) are able to measure surfaces at high accuracy. However, internal surfaces that are out of reach for the probes and laser light or hidden areas cannot be controlled.
Waygate Technologies' advanced high precision industrial metrology systems include CT-scanners that provide high-resolution insight not only on internal defects but also capture any internal surfaces with just a single scan, allowing non-destructive detection of any geometry deviations.
We used to be GE Inspection Technologies, now we’re Waygate Technologies, a global leader in NDT solutions with more than 125 years of experience in ensuring quality, safety and productivity.
How accurate is accurate?
The measurement accuracy of a CT system is defined by knowing and compensating the systems' uncertainties. To reference, the VDI 2630 standard is the recognized guideline for CT based metrology, providing a standardized procedure to determine the accuracy of a system. Hence, a CT system with a statement about its measurement accuracy and uncertainties referring to the VDI 2630 guideline can easily be compared with other CT systems according to its basic metrology specification. The feasibility of a CT system for a given application, of course, depends on all its components.
Due to our long experience, going back to the early beginnings of industrial CT, Waygate Technologies guarantees excellent image and volume data quality, which is the foundation of any following precise measurements. By combining proprietary core components such as detectors, tubes, or patented scatter|correct or high-flux|target technologies with newly developed advanced correction methods like true|position, the very competitive metrology performance of SD= (3.8 + L/100 mm) µm according to VDI 2630 can be achieved.
Key Metrology Applications
Research & Development, Metrology Labs
Measurement technicians in R&D and quality labs require incredibly accurate industrial metrology measurements for:
- First article inspection
- Reverse engineering
- New construction simulations
- New materials with its inner structure and behavior
Measurement accuracy and reliability are critical during many steps in the production process, including:
- Quality control
- Production ramp-up
- Tool correction
- Dimensional control such as wall thickness analyses
- Process optimization
- Post Process control
- Final assembly control
Metrology 2.0: A new era in reliable precision measurement
Measure: ruby|plate phantom
The patented fully VDI 2630 compliant ruby|plate phantom allows measuring in all directions with one scan, allowing 3 times faster system accuracy verification without any user interaction.
true|position is the advanced method for compensation of residual system mechanical uncertainties included in the Metrology 2.0 package. It expands the two measurement positions with VDI 2630 specified accuracy to all positions which can be verified with the ruby|plate phantom:
• New VDI 2630 specification: SD= (3.8 + L/100 mm) μm (2 positions per standard)
• Specification for any other position: SD= (5.5 + L/50 mm) μm
Additionally, by applying the fully automated easy|calib, the VDI specification (3.8 + L/100 mm) µm can be met at any position with just a few minutes of calibrating.
Calibrate: voxel|calib and easy|calib
The fully-automated voxel|calib procedure allows calibration of the CT system with just one simple click – anytime when needed!
Additionally, the easy|calib local calibration tool eliminates remaining magnification errors at any given position, enabling CT users to achieve the VDI specification (3.8 + L/100 mm) µm at any position with just a few minutes of calibrating.
Analyze: datos|x metrology|check
The easy to use datos|x metrology|check software tool enables full-scale validation, monitoring and reporting of the CT systems metrology performance. Quickly analyze validation results, export detailed PDF reports, or perform routine equipment checks.
metrology|check is applied for a quick reassurance in a new technology as well as to ensure compliance with internal metrology requirements and guidelines as part of measuring equipment monitoring routines.