2D X射线和3D CT扫描仪 | 检测和无损检测

phoenix microme|x neo和nanome|x neo

phoenix microme|x neonanome|x neo将高分辨率的2D X射线技术和3D计算机断层扫描(CT)整合于一个系统中,使之能够对工业、汽车、航空和消费性电子产品行业中的电子部件(例如半导体、PCBA、锂离子电池)进行无损检测(NDT)phoenix microme|x neonanome|x neo具有创新的工程技术和超高的定位精度,非常适合工业电子产品的中间过程X射线检测、质量控制、故障分析和研发。

 

独特的特性

 

采用基于μAXI的易编程CAD,实现微米数量级的自动检测

180 kV配置下高动态实时成像的主动冷却过程

3D CT/平面CT扫描的卓越实时成像和快速数据采集具备以下特点:

GE高动态DXR平板探测器的速度达每秒30

使用Diamond窗口,在相同的高像质水平下,数据采集速度可提高2

提供在10秒内完成3D CT扫描的选项

Unique features

  • Automated inspection in micrometer range with easy to program CAD based μAXI
  • Active cooling for high dynamic, live imaging at 180 kV configurations
  • Brilliant live imaging and fast data acquisition for 3D CT / planarCT scanning with:
  • 30 frames per second with Waygate Technologies’ highly dynamic DXR flat panel detector
  • Up to 2 times faster data acquisition at same high image quality level with diamond|window
  • Option provided for 3D CT scans within up to 10 seconds

We used to be GE Inspection Technologies, now we’re Waygate Technologies, a global leader in NDT solutions with more than 125 years of experience in ensuring quality, safety and productivity.

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