Earlier this year, Waygate Technologies launched a new release of our Phoenix Nanome|x and Microme|x Neo product, introducing the latest industry standard for microfocus and Nanofocus X-ray and CT—including Planar CT--inspection capability with a focus on electronics inspection applications. The new release provides:
- More detector options to better suit multiple applications
- An optimized X-ray tube to protect X-ray-sensitive components
- Enhanced software features for increased efficiency and ease of use
Key features and benefits:
- Ultra-high-resolution detector option with 100/85μm pixel size for small sized components and semiconductors
- Smart X-ray tube and dose measurement protects (inspected) components from prolonged X-ray radiation
- Automatic inspection reports are generated for enhanced efficiency and ease of use
- Manufacturing Execution System (MES) interface and CAD file import option increase system interconnectivity
As the global leader in non-destructive testing (NDT), we obsess over the little things, so you don't have to. We ensure safety, quality and productivity for major industries around the world.
Inspection starts here.
Innovation starts here.
In this podcast, ARC Vice President Craig Resnick interviews two leaders from Waygate Technologies, a Baker Hughes business: Oliver Brunke, Product Management Team Leader and Udo de Vries, Growth and Strategy Leader, to discuss for example, what are the advantages of computed tomography in Lithium Ion battery cell inspection; in which phases of the product lifecycle can computed tomography be applied for batteries, which types of batteries and battery systems can be inspected, at which customer locations can CT be applied for batteries, and what kind of failures can computed tomography detect for Lithium Ion batteries.